Volume 4, Number 2—June 1998
Perspective
Accommodating Error Analysis in Comparison and Clustering of Molecular Fingerprints
Figure 1
![The align-and-count method finds the maximum number of mutually closest bands within a threshold deviation value ∆, for a search across a range S of scaling values. The two lanes are scaled incrementally, thus searching for the best alignment.](/eid/images/98-0203-F1.jpg)
Figure 1. The align-and-count method finds the maximum number of mutually closest bands within a threshold deviation value ∆, for a search across a range S of scaling values. The two lanes are scaled incrementally, thus searching for the best alignment.
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